V|tome|x M
Versatile, high-performance, industrial, microfocus CT equipment for metrology and flaw detection tasks, non-destructive material testing. The machine is also available with dual tube option, making it suitable for high wall thickness and high-resolution specimens. The X-ray tube, the associated high-voltage generator and the detector are all developed in-house. Using VG Studio software, CT scan data can be mapped and analysed in detail. The equipment is ideal for the analysis of complete electronic assemblies, castings or scientific samples.
- Details
- Parameters
- Options
-Microfocus direct, cooled, openable X-ray tube
-Long filament life
-High resolution, temperature stabilised Dynamic 41 detector
-5 axis motion system on granite bed (X,Y,Z, rotation, detector shift)
-Testing of electronics, castings, injection moulded and welded products
-300kV / 500W Microfocus direct, cooled, openable, high power X-ray tube
-Detectability: 1,5 um
-180kV / 20W Nanofocus transmission X-ray tube with diamond target
-Detectability: 0,6 um
-Max. sample sizes: 500 x 600 mm, 50 kg (20kg for air bearing)
-5 axis motion system on granite bed (X,Y,Z, rotation, detector shift)
-Equipment dimensions: 2,620 mm x 2,060 mm x 2,980 mm, max. 8600kg (option dependent)
-Dual-tube option: 2. 180kV nanofocus X-ray tube
-Metrological packages: air bearing, calibrated measurement
-Scatter|correction: minimises noise when testing thick castings
–High-flux target: faster scanning, better resolution
–Offset|scan
–Helix|Scan
–Fast|scan
–Sector|scan
–Click & Measure
–Flash|filter
–Volume Graphics software package for visualisation, analyses, simulations
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v|tome|x M
Resolution and performance in one machine.
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Directional pipe
High performance and high resolution with endless uptime.
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Metrology
Compare sample sizes with CAD data.
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Airflow obstruction analysis
Detection and sizing of inclusions in the mould.
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VG Studio software
For image reconstruction and analysis of scanned data.
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Sensor
High resolution 3D inspection of microelectronic assemblies.
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Bonded joint
Up to micro-wire bonding control.
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USB drive
Scanning of complete products is possible.
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Material testing
Testing inhomogeneous materials, composites.
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Micromechanics
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Geology
Material science analysis of medium samples, minerals is feasible.
Videos
Metrology
High-resolution CT scanning can also measure the internal dimensions of the parts in a short inspection time.
Pendrive from the inside.
Exceptional resolution with the combination of GE CT technology and Volume Graphics image reconstruction and analysis software.
GE CT technology
High-resolution, non-destructive testing technology helps you achieve higher quality and productivity.
Dynamic41 detector
High resolution digital detector