Waygate MICROME|X AND NANOME|X NEO

Electronic components, circuits, plastic products, cable assemblies or even castings can be tested.

Micromex

• 180 kV / 20 W openable microfocus X-ray tube with submicron detection capability
• 0 – 70° tilting detector
• GE DXR temperature stabilized digital detector or DXR S100 Pro detector
• Diamond target: better resolution at higher power, longer target life
• Application can be found and tested at in our ELAB showroom!
• The possibility of X-ray examination with professional support!

Nanomex

• For high-resolution automated X-ray analysis
• 0,2-0,3 micron detection capability
• 180 kV / 15 W nanofocus open tube design

• Planar CT software package for testing multi-layer electronic assemblies
• CT to upgrade for testing sensors, electronic PCBs, components
• Flash! Filters™ contrast optimisation for the human eye
• Up to twice as fast data capture with unchanged image quality and diamond window
• VG Studio CT visualisation and analysis software available for our machines
• DXR S100 Pro detector:
  • The temperature stabilized detector provides a superior 100 µm pixel resolution and frame rates up to 30 frames per second which combines outstanding detectability with high efficiency
• DXR250RT detector:
  • Temperature stabilized full frame rate of 30 frames per second at 1000×1000 pixels offers low noise coupled with brilliant image quality ensuring fast and detailed live inspection

• Tube voltage: 10-180kV
• Tube power: 20W (15W nanofocus tube with diamond window)
• Target: tungsten target on diamond window
• Total magnification: up to 22.150x
• Best detail detectability: up to 0.5 µm or 0.2 µm
• Maximum scannable area: 460 mm x 360 mm
• Optional without rotation unit: 610 mm x 510 mm
• Maximum sample size and weight:
•  680mm x 635mm, 10 kg
• System dimensions: 2,160mm x 1,920mm x 1,590mm
• System weight: 3100 kg