Waygate OPTIONS

Extensive hardware and software support

Waygate offers a wide range of hardware and software options to increase quality and reduce the time required for testing. Waygate options available:

CT option: available for Micromex and Nanomex equipment
Planar CT option: a quick and easy 3D inspection option, especially for complex and large printed circuit boards
Flash! filter: automatically displays important details on to the X-ray images using contrast highlighting
Dynamic41 detectors: 2X resolution in the same time, or 2-3X faster scanning without quality degradation compared to DXR detectors
Diamond|window: a diamond target that allows a smaller focal spot (higher resolution) to be achieved with the same performance, due to its good thermal conductivity.
Helix|scan: Longer parts that would not fit in one scan can be scanned with better quality than multiscan. During scanning, the sample moving in helical line.
High-flux|target: 2X faster scanning with the same image quality, or 2X resolution in the same time.
Scatter|correct: For perfect and noise-free testing of thick and high-density samples. This technology greatly shortens the CT scan time compared to line detector scans with the same image quality.
Long-life|filament: up to 10X the lifetime of a normal cathode
Click & Measure|CT: Full automatic scanning and evaluation
Fast|scan: CT scan during continuous rotation of the sample. The scan time can be drastically reduced.
Sector|scan: <360° rotational scanning capability for high-resolution CT scanning of larger samples.
Quick|pick: Automatic pattern matching system